
德(de)國EL-CELL電(dian)極測試(shi)模塊PAT-Tester-i-16產(chan)品介紹
內(nei)部阻抗(kang)分析(xi)儀能夠(gou)同(tong)時(shi)記錄半(ban)單(dan)元阻抗(kang)。直(zhi)觀,易(yi)於使用(yong),但(dan)功(gong)能強大(da)的(de)實(shi)驗生成器(qi)使電(dian)池(chi)研(yan)究初(chu)學者能夠(gou)設(she)置所有(you)常見測試,如CCCV循(xun)環,伏(fu)安法和(he)阻(zu)抗測量(liang)。強(qiang)大的(de)腳(jiao)本(ben)語言允許(xu)有(you)經(jing)驗的(de)科(ke)學家建(jian)立幾(ji)乎(hu)任(ren)何類(lei)型(xing)的(de)電(dian)池(chi)測試(shi)。所有(you)測(ce)試(shi)通(tong)道(dao)都具(ju)有(you)開關(guan)矩(ju)陣,用(yong)於在半(ban)連(lian)接和(he)全(quan)電(dian)池(chi)測量(liang)之(zhi)間進行(xing)軟(ruan)件(jian)控(kong)制切換,無需重(zhong)新連(lian)接任(ren)何電(dian)纜。很先(xian)進的(de)圖形(xing)功(gong)能允許(xu)用(yong)戶使用(yong)任(ren)何存儲到(dao)數(shu)據庫(ku)的(de)實(shi)驗來(lai)查(zha)看(kan)和(he)比較(jiao)運(yun)行(xing)實(shi)驗(yan)的(de)數(shu)據。

PAT-Tester-i-16將溫度控(kong)制的(de)電(dian)池(chi)室和(he)對(dui)接(jie)站(zhan)與電(dian)池(chi)測試(shi)儀集(ji)成到(dao)壹個儀器中(zhong)。
16個(ge)PAT系列測試單(dan)元(yuan)的(de)獨(du)立通道(dao)每個通(tong)道(dao)具(ju)有(you)全(quan)功(gong)能恒(heng)電(dian)位儀/恒(heng)電(dian)流/阻(zu)抗分(fen)析(xi)儀集(ji)成Peltier溫度控(kong)制,溫度範圍(wei)為+5至+ 80°C
支(zhi)持的(de)功(gong)能:
C:充(chong)電(dian)/放電(dian)/阻抗(kang)所有(you)測(ce)試(shi)電(dian)池(chi)功能支(zhi)持
T:溫度控(kong)制壹(yi)些(xie)測(ce)試單(dan)元(yuan)的(de)功(gong)能不完(wan)支(zhi)持
P:氣(qi)壓
顏(yan)色:
藍(lan):支(zhi)持所(suo)有(you)測(ce)試(shi)單(dan)元(yuan)功能
灰(hui):壹些(xie)測(ce)試單(dan)元(yuan)格(ge)功(gong)能不完(wan)支(zhi)持
黑:測試(shi)單(dan)元不兼容
測(ce)試容量高(gao)達16個測試(shi)單(dan)元(yuan)數(shu)據記錄儀同時(shi)記錄半(ban)電(dian)池(chi)電(dian)壓和(he)傳(chuan)感(gan)器(qi)信(xin)號(hao)(例如溫度,壓力(li)附(fu)加功(gong)能多(duo)通道(dao)恒(heng)電(dian)流/恒(heng)流/阻(zu)抗分(fen)析(xi)儀; 溫度控(kong)制室(shi)(Peltier)
PAT兼(jian)容性表